T/CIE 120-2021 Active Group standards

T/CIE 120-2021 Hardware Trojan detection method for semiconductor integrated circuits

Publish Date: 2021-11-22 Implement Date: 2022-02-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: T/CIE 120-2021

Standard Type: Group standards

Standard Status: Active

is_force_gb: no

CCS Name: Microcircuit

ICS Name: Integrated circuits, microelectronics

Publish Date: 2021-11-22

Implement Date: 2022-02-01

Pages: 16 pages

Scope

This document establishes the methods and procedures for hardware Trojan detection in semiconductor integrated circuits.
This document is applicable to hardware Trojan detection in integrated circuits that are independently designed but not subject to controlled manufacturing processes. It can be used by providers of integrated circuits, users of integrated circuits, and third-party organizations to evaluate the security of integrated circuit products. Here, "third-party" refers to independent institutions that conduct certification, appraisal, and testing services during the delivery of integrated circuit products.

Development Information

Word Count: 31 Thousand words Pages: 16 pages

Referenced Standards

GB/T 9178-1988 Terminology for integrated circuits GB/T 14113-1993 Terminology of packages for semiconductor integrated circuits GB/T 17574-1998 Semiconductor devices Integrated circuits Part 2:Digital integrated circuits GB/T 17574.9-2006 Semiconductor devices—Integrated circuits—Part 2-9:Digital integrated circuits—Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories GB/T 17574.10-2003 Semiconductor devices-Integrated circuits—Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories GB/T 17574.11-2006 Semiconductor devices—Integrated circuits—Part 2-11:Digital integrated circuits—Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory GB/T 17574.20-2006 Semiconductor devices—Integrated circuits—Part 2-20:Digital integrated circuits—Family specification—Low voltage integrated circuits

Related Standards

GB/T 4855-1984 Abolished

GB/T 4855-1984 Families and products of linear amplifier for semiconductor integrated circuits

Publish Date: 1984-12-18

GB/T 3434-1986 Abolished

GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits

Publish Date: 1986-04-02

GB/T 3431.2-1986 Active

GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins

Publish Date: 1986-07-01

GB/T 6648-1986 Active

GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories

Publish Date: 1986-07-31

GB/T 6800-1986 Abolished

GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits

Publish Date: 1986-08-28

GB/T 3435-1987 Abolished

GB/T 3435-1987 Series and products for semiconductor CMOS integrated circuits—Products of families 4000

Publish Date: 1987-01-21