Standards

YS/T 587.5-2024 Active

YS/T 587.5-2024 YS/T 587.5-2024 Test Methods for Carbon Anode Using Post-combustion Petroleum Coke Part 5: Determination of Trace Element Content by Inductively Coupled Plasma Atomic Emission Spectroscopy (ICP-AES)

This document is applicable to the determination of trace element content in samples with a ash content (by mass) of less than 1% in carbon anodes. The determination of trace element content in petroleum coke and pre-baked anodes can be used as a reference for this method.

Publish Date: 2024-10-24

YS/T 493-2024 Active

YS/T 493-2024 YST 493-2024 Aluminum Alloy Extruded Tubes for Internal Combustion Engines of 4XXX Series

This document is applicable to 4××× series aluminum alloy extruded rods used in internal combustion engines

Publish Date: 2024-10-24

YS/T 63.11-2024 Active

YS/T 63.11-2024 Test Methods for Aluminum Carbonaceous Materials - Part 11: Determination of Air Reactivity

This document is applicable to the determination of the air reactivity of pre-baked anodes and side-mounted carbon blocks. Other aluminum carbon products can be used for reference

Publish Date: 2024-10-24

YS/T 63.7-2024 Active

YS/T 63.7-2024 YS/T 63.7-2024 Aluminum Carbon Material Test Method - Part 7: Determination of apparent density - Size method

This document is applicable to samples with simple shapes or regular geometrical forms and smooth surfaces.

Publish Date: 2024-10-24

YS/T 535.3-2024 Active

YS/T 535.3-2024 YS/T 535.3-2024 Chemical analysis methods for sodium fluoride - Part 3: Determination of silicon dioxide content - Molybdenum blue spectrophotometric method

This document is applicable to the determination of the silica content in sodium fluoride, with a measurement range of 0.020% to 1.60%.

Publish Date: 2024-10-24

YS/T 517-2024 Active

YS/T 517-2024 YS/T 517-2024 Sodium Fluoride

This document is applicable to sodium fluoride, which is produced by the reaction of sodium fluorosilicate and sodium carbonate

Publish Date: 2024-10-24

YS/T 581.4-2024 Active

YS/T 581.4-2024 YS/T 581.4-2024 Fluoride Aluminum Chemical Analysis and Determination of Physical Properties - Part 4: Determination of Aluminum Content - EDTA Titration Method

This document is applicable to the determination of aluminum content in aluminum fluoride, with a measurement range of 25.00% to 35.00%.

Publish Date: 2024-10-24

YS/T 273.12-2024 Active

YS/T 273.12-2024 YS/T 273.12-2024 Test methods for chemical analysis and determination of physical properties of crystophanite - Part 12: Determination of calcium oxide content - Flame atomic absorption spectrometry

This document is applicable to the determination of the calcium oxide content in cryolite, with a measurement range of 0.0050% to 3.00%.

Publish Date: 2024-10-24

YS/T 273.7-2024 Active

YS/T 273.7-2024 YS/T 273.7-2024 Ice-crystaltreatment method for chemical analysis and determination of physical properties Part 7: Determination of iron oxide content by spectrophotometry using o-phenanthroline method

This document is applicable to the determination of the iron trioxide content in cryolite, with a measurement range of 0.0050% to 0.50%.

Publish Date: 2024-10-24

YS/T 1711-2024 Active

YS/T 1711-2024

This document is applicable to the binding of target materials used in the production of indium tin oxide (ITO) transparent conductive films by powder metallurgy methods

Publish Date: 2024-10-24

YS/T 1703-2024 Active

YS/T 1703-2024 Test of surface particles on chip packaging trays for counting liquid particles in YS/T 1703-2024

This document is applicable to the cleanliness test of silicon polished wafers, silicon epitaxial wafers, SOI wafers, and semiconductor wafers of other materials with diameters of 100mm, 125mm, 150mm, 200mm, and 300mm in packaging boxes and granules

Publish Date: 2024-10-24

YS/T 28-2024 Active

YS/T 28-2024 YS/T 28-2024 Silicon wafer packaging and labeling

This document is applicable to silicon single-crystal polished wafers, silicon epitaxial wafers, SOI silicon wafers, silicon single-crystal corroded wafers, silicon single-crystal polished wafers, and silicon wafers used in solar cells. Other wafers can be used as a reference for this document

Publish Date: 2024-10-24