QJ 10008-2008
Active
Standards
Current Category: CN-QJ - Aerospace
QJ 10004-2008
Active
QJ 10004-2008 Total dose radiation testing method of semiconductor devices for space applications
QJ 10003-2008
Active
QJ 10003-2008 Screening guideline for import components
QJ 10005-2008
Active
QJ 10005-2008 Test guidelines of single event effects induced by heavy ions of semiconductor devices for space applications
QJ 2779-1995
Active
QJ 2779-1995
QJ 488A-1995
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QJ 488A-1995 Printed circuit board plating tin-lead alloy process technical requirements
QJ 2777.2-1995
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QJ 2777.2-1995
QJ 2776-1995
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QJ 2776-1995 Printed circuit board continuity testing requirements and methods
QJ 167A-1995
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QJ 167A-1995
QJ 166A-1995
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QJ 166A-1995
QJ 2774.1-1995
Active
QJ 2774.1-1995 Material classification and code: Metal materials section
QJ 2775-1995
Active