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GB/T 45459-2025 Active
GB/T 45459-2025 Microbeam analysis—Focused ion beam—Preparation of TEM specimens
Abstract
This document specifies the instrumentation, environmental and sample requirements, sample preparation, and experimental records for preparing transmission electron microscopy (TEM) samples using focused ion beam (FIB) methods.
This document is applicable to the preparation of TEM samples for solid materials such as metal materials, semiconductors, minerals, and polymer materials.
This document is applicable to various types of focused ion beam field-emission scanning electron microscope dual-beam systems. Single-beam systems and multi-beam systems should refer to and implement this document accordingly.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 45459-2025 |
| CCS | Basic standards and general methods |
| ICS | Chemical analysis |
| Implement Date | 2025-10-01 |
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