GB/T 45459-2025 Active National standards

GB/T 45459-2025 Microbeam analysis—Focused ion beam—Preparation of TEM specimens

Publish Date: 2025-03-28 Implement Date: 2025-10-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: GB/T 45459-2025

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Basic standards and general methods

ICS Name: Chemical analysis

Publish Date: 2025-03-28

Implement Date: 2025-10-01

Pages: 20 pages

Scope

This document specifies the instrumentation, environmental and sample requirements, sample preparation, and experimental records for preparing transmission electron microscopy (TEM) samples using focused ion beam (FIB) methods.
This document is applicable to the preparation of TEM samples for solid materials such as metal materials, semiconductors, minerals, and polymer materials.
This document is applicable to various types of focused ion beam field-emission scanning electron microscope dual-beam systems. Single-beam systems and multi-beam systems should refer to and implement this document accordingly.