GB/T 4937.26-2023 Active
GB/T 4937.26-2023 Semiconductor devices—Mechanical and climate test methods—Part 26:Electrostatic discharge(ESD)sensitivity testing—Human body model(HBM)
Abstract
This document establishes an ESD test, evaluation, and classification procedure for components and microcircuits based on their sensitivity to damage or degradation caused by electrostatic discharge (ESD) to the specified human body model (HBM). The purpose of this document is to establish a test method that can reproduce HBM failures and provide reliable, reproducible HBM ESD test results for different types of components, ensuring that the test results are not affected by the testing equipment. Reproducible data can guarantee accurate classification and comparison of HBM ESD sensitivity levels. For ESD testing of semiconductor devices, this test method, the machine model (MM) test method (see IEC 60749-27), or other ESD test methods in IEC 60749 (all parts) can be selected. Unless otherwise specified, this test method is the selected method.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.26-2023 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2024-04-01 |