GB/T 14264-1993
Replaced
GB/T 4937.26-2023
Active
National standards
GB/T 4937.26-2023 Semiconductor devices—Mechanical and climate test methods—Part 26:Electrostatic discharge(ESD)sensitivity testing—Human body model(HBM)
GB/T 4937.26-2023 Semiconductor devices—Mechanical and climate test methods—Part 26:Electrostatic discharge(ESD)sensitivity testing—Human body model(HBM)
Basic Information
Standard Code:
GB/T 4937.26-2023
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
Integrated Components of Semiconductor Devices
Publish Date:
2023-09-07
Implement Date:
2024-04-01
Publisher:
国家市场监督管理总局、国家标准化管理委员会
Technical Committee:
全国半导体器件标准化技术委员会(SAC/TC 78)
Pages:
45 pages
Scope
本文件依据元器件和微电路对规定的人体模型（HBM）静电放电（ESD）所造成损伤或退化的敏感度，建立了元器件和微电路的ESD测试、评价和分级程序。本文件的目的是建立一种能够复现HBM失效的测试方法，并为不同类型的元器件提供可靠、可重复的HBM ESD测试结果，且测试结果不因测试设备而改变。重复性数据可以保证HBM ESD敏感度等级的准确划分及对比。半导体器件的ESD测试从本测试方法、机器模型（MM）测试方法（见IEC 6074927）或IEC 60749（所有部分）中的其他ESD测试方法中选择。除另有规定外，本测试方法为所选方法。
Development Information
Drafting Units:
中国电子科技集团公司第十三研究所、河北北芯半导体科技有限公司、安徽荣创芯科自动化设备制造有限公司、北京赛迪君信电子产品检测实验室有限公司、河北中电科航检测技术服务有限公司、捷捷半导体有限公司、佛山市川东磁电股份有限公司
Drafting Persons:
高蕾、张魁、鲁世斌、迟雷、翟玉颖、彭浩、高金环、张瑞霞、黄杰、赵鹏、徐昕、魏兵、黎重林、颜天宝、金哲
Same series standard
GB/T 4937.23-2023 Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life
GB/T 4937.27-2023 Semiconductor devices—Mechanical and climatic test methods—Part 27:Electrostatic discharge (ESD) sensitivity testing—Machine model (MM)
GB/T 4937.31-2023 Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devices(internally induced)
GB/T 4937.32-2023 Semiconductor devices—Mechanical and climatic test methods—Part 32:Flammability of platic-encapsulated devices(externally induced)
GB/T 4937.42-2023 Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage
Adopt standards
IEC 60749-26:2018
Related Standards
GB/T 14844-1993
Replaced
GB/T 14844-1993 Designations of semiconductor materials
GB/T 17573-1998
Active
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General
GB/T 12560-1999
Active
GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices
GB/T 11499-2001
Active
GB/T 11499-2001 Letter symbols for discrete semiconductor devices
GB/T 20521-2006
Active