GB/T 4937.26-2023 Active National standards

GB/T 4937.26-2023 Semiconductor devices—Mechanical and climate test methods—Part 26:Electrostatic discharge(ESD)sensitivity testing—Human body model(HBM)

Publish Date: 2023-09-07 Implement Date: 2024-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: GB/T 4937.26-2023

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor discrete devices

ICS Name: Integrated Components of Semiconductor Devices

Publish Date: 2023-09-07

Implement Date: 2024-04-01

Pages: 45 pages

Scope

This document establishes an ESD test, evaluation, and classification procedure for components and microcircuits based on their sensitivity to damage or degradation caused by electrostatic discharge (ESD) to the specified human body model (HBM). The purpose of this document is to establish a test method that can reproduce HBM failures and provide reliable, reproducible HBM ESD test results for different types of components, ensuring that the test results are not affected by the testing equipment. Reproducible data can guarantee accurate classification and comparison of HBM ESD sensitivity levels. For ESD testing of semiconductor devices, this test method, the machine model (MM) test method (see IEC 60749-27), or other ESD test methods in IEC 60749 (all parts) can be selected. Unless otherwise specified, this test method is the selected method.