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GB/T 20724-2006
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
Abstract
This standard specifies the convergent beam electron diffraction method for measuring the thickness of thin crystal samples using a transmission electron microscope. This method is suitable for measuring the thickness of thin crystals with a linear dimension of 10-9 m to 0.1×10-3 m and a thickness ranging from tens to hundreds of nanometers.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Replaced |
| Standard Code | GB/T 20724-2006 |
| CCS | Electrochemical, thermochemical, and optical analytical instruments |
| ICS | Other standards related to analytical chemistry |
| Implement Date | 2007-08-01 |
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