MT/T 707-1997
Active
GB/T 20724-2006
Replaced
National standards
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
Basic Information
Standard Code:
GB/T 20724-2006
Standard Type:
National standards
Standard Status:
Replaced
is_force_gb:
no
CCS Name:
Electrochemical, thermochemical, and optical analytical instruments
ICS Name:
Other standards related to analytical chemistry
Publish Date:
2006-12-25
Implement Date:
2007-08-01
Pages:
6 pages
Scope
This standard specifies the convergent beam electron diffraction method for measuring the thickness of thin crystal samples using a transmission electron microscope. This method is suitable for measuring the thickness of thin crystals with a linear dimension of 10-9 m to 0.1×10-3 m and a thickness ranging from tens to hundreds of nanometers.
Development Information
Superseded by the following standards
Referenced Standards
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