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T/CIE 126-2021 Active
T/CIE 126-2021 Test Method for Magnetic Random Access Memory Chips
Abstract
Main technical content: This standard provides terms, test principles, test environments, test equipment, and test procedures for magnetic random-access memory (MRAM) chip testing. This standard is applicable to magnetic random-access memory chip testing and verification of the key performance (reliability and electrical parameters, etc.) of magnetic random-access memory chips.
General Product Information
| Document Type | Group standards |
|---|---|
| Standard Status | Active |
| Standard Code | T/CIE 126-2021 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated circuits, microelectronics |
| Implement Date | 2022-02-10 |
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