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GB/T 30860-2014 Active
GB/T 30860-2014 Test methods for surface roughness and saw mark of silicon wafers for solar cells
Abstract
This standard specifies the surface roughness and the contact or non-contact profile testing methods for scribing lines on silicon wafers used in solar cells (hereinafter referred to as "silicon wafers").
This standard applies to monocrystalline and polycrystalline silicon wafers processed by wire cutting. If it is necessary to apply it to other products, the relevant parties need to reach an agreement through consultation.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 30860-2014 |
| CCS | \nTest methods for the physical properties of metals |
| ICS | \nMetal material testing |
| Implement Date | 2015-04-01 |
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