GB/T 30860-2014 Active National standards

GB/T 30860-2014 Test methods for surface roughness and saw mark of silicon wafers for solar cells

GB/T 30860-2014 Test methods for surface roughness and saw mark of silicon wafers for solar cells

Publish Date: 2014-07-24 Implement Date: 2015-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 30860-2014
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: \nTest methods for the physical properties of metals
ICS Name: \nMetal material testing
Publish Date: 2014-07-24
Implement Date: 2015-04-01
Pages: 12 pages

Scope

This standard specifies the surface roughness and the contact or non-contact profile testing methods for scribing lines on silicon wafers used in solar cells (hereinafter referred to as "silicon wafers").
This standard applies to monocrystalline and polycrystalline silicon wafers processed by wire cutting. If it is necessary to apply it to other products, the relevant parties need to reach an agreement through consultation.

Development Information

Word Count: 20 Thousand words Pages: 12 pages

Referenced Standards

GB/T 1031-1995 Surface roughness parameters and their values GB/T 1031-2009 Geometrical Product Specifications (GPS)—Surface texture:Profile method—Surface roughness parameters and their values GB/T 3505-2000 Geometrical product specifications (GPS)—Surface texture:Profile method—Terms, definitions and surface texture parameters GB/T 3505-2009 Geometrical Product Specifications (GPS)—Surface texture:Profile method—Terms,definitions and surface texture parameters GB/T 10610-1998 Geometrical product Specifications(GPS)—Surface texture:Profile method—Rules and procedures for the assessment of surface texture GB/T 10610-2009 Geometrical Product Specifications(GPS)—Surface texture:Profile method—Rules and procedures for the assessment of surface texture GB/T 14264-1993 Semiconductor materials—Terms and definitions GB/T 14264-2009 Semiconductor materials—Terms and definitions GB/T 14264-2024 Terminology of semiconductor materials GB/T 18777-2002 Geometrical product specifications (GPS)—Surface texture:Profile method—Metrological characteristics of phase correct filters GB/T 18777-2009 Geometrical Product Specifications(GPS)—Surface texture:Profile method—Metrological characteristics of phase correct filters GB/T 26071-2010 Mono-crystalline silicon as cut slices for photovoltaic solar cells GB/T 26071-2018 Monocrystalline silicon wafers for solar cells GB/Z 26958.1-2011 Geometrical Product Specifications(GPS)—Filtration—Part 1:Overview and basic concepts GB/Z 26958.20-2011 Geometrical Product Specifications(GPS)—Filtration—Part 20:Linear profile filters:Basic concepts GB/T 26958.21-2020 Geometrical product specifications (GPS)—Filtration—Part 21:Linear profile filters:Gaussian filters GB/Z 26958.22-2011 Geometrical Product Specifications(GPS)—Filtration—Part 22:Linear profile filters:Spline filters GB/T 26958.28-2020 Geometrical product specifications (GPS)—Filtration—Part 28:Profile filters:End effects GB/Z 26958.29-2011 Geometrical Product Specifications(GPS)—Filtration—Part 29:Linear profile filters:Spline wavelets GB/T 26958.29-2024 Geometrical product specifications(GPS)—Filtration—Part 29:Linear profile filters—Wavelets GB/Z 26958.30-2017 Geometrical product specifications(GPS)—Filtration—Part 30:Robust profile filters—Basic concept GB/Z 26958.31-2011 Geometrical Product Specifications(GPS)—Filtration—Part 31:Robust profile filters—Gaussian regression filters GB/Z 26958.32-2011 Geometrical Product Specification(GPS)—Filtration—Part 32:Robust profile filters:Spline filters GB/Z 26958.40-2011 Geometrical Product Specifications(GPS)—Filtration—Part 40:Morphological profile filters:Basic concepts GB/Z 26958.41-2011 Geometrical Product Specifications(GPS)—Filtration—Part 41:Morphological profile filters:Disk and horizontal segment filters GB/Z 26958.49-2011 Geometrical Product Specification(GPS)—Filtration—Part 49:Morphological profile filter:Scale space techniques GB/T 26958.60-2023 Geometrical product specifications (GPS)—Filtration—Part 60:Linear areal filters—Basic concepts GB/T 26958.61-2023 Geometrical product specification (GPS)—Filtration—Part 61:Linear areal filters—Gaussian filters GB/T 26958.71-2022 Geometrical product specifications (GPS)—Filtration—Part 71:Robust areal filters—Gaussian regression filters GB/T 26958.85-2022 Geometrical product specifications(GPS)—Filtration—Part 85:Morphological areal filters—Segmentation GB/T 29055-2012 Multi-crystalline silicon wafer for solar cell GB/T 29055-2019 Multicrystalline silicon wafers for photovoltaic solar cell GB/T 29505-2013 Test method for measuring surface roughness on planar surfaces of silicon wafer GB/T 30859-2014 Test method for warp and waviness of silicon wafers for solar cells GB/T 26958.20-2025 Geometrical product specifications(GPS)—Filtration—Part 20:Linear profile filters:Basic concepts GB/T 26958.1-2025 Geometrical product specifications(GPS)—Filtration—Part 1:Overview and basic concepts GB/T 26958.30-2025 Geometrical product specifications (GPS)—Filtration—Part 30:Robust profile filters: Basic concepts GB/T 26071-2026 Monocry stallinesilicon and wafers for solar cells

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