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GB/T 19922-2005 Active
GB/T 19922-2005 Standard test methods for measuring site flatness on silicon wafers by noncontact scanning
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 19922-2005 |
| CCS | Analysis methods for semi-metallic and semiconductor materials |
| ICS | Comprehensive Testing of Metal Materials |
| Implement Date | 2006-04-01 |
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