GB/T 19922-2005 Active National standards

GB/T 19922-2005 Standard test methods for measuring site flatness on silicon wafers by noncontact scanning

Publish Date: 2005-09-19 Implement Date: 2006-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 19922-2005

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Analysis methods for semi-metallic and semiconductor materials

ICS Name: Comprehensive Testing of Metal Materials

Publish Date: 2005-09-19

Implement Date: 2006-04-01

Pages: 9 pages

Development Information

Word Count: 14 Thousand words Pages: 9 pages

Referenced Standards

ASTMF 1530-94 GB/T 14264-1993 Semiconductor materials—Terms and definitions GB/T 14264-2009 Semiconductor materials—Terms and definitions GB/T 14264-2024 Terminology of semiconductor materials

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Publish Date: 1997-06-03

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