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GB/T 4937.31-2023 Active
GB/T 4937.31-2023 Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devices(internally induced)
Abstract
This document is applicable to semiconductor devices (discrete devices and integrated circuits), hereinafter referred to as devices.
This document is used to determine whether the devices burn due to internal heating caused by overload.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.31-2023 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2023-12-01 |
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