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GB/T 30656-2014
GB/T 30656-2014 Polished monocrystalline silicon carbide wafers
Abstract
This standard specifies the requirements, inspection methods, inspection rules, marking, packaging, transportation, storage, quality certificates, and order forms (or contracts) for 4H and 6H silicon carbide single-crystal polished wafers.
This standard applies to silicon carbide single-crystal polished wafers prepared by single- or double-sided polishing of 4H and 6H silicon carbide single-crystal grinding wafers. The products are mainly used to fabricate epitaxial substrates for semiconductor lighting and power electronic devices.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Replaced |
| Standard Code | GB/T 30656-2014 |
| CCS | Compound semiconductor materials |
| ICS | Semiconductor materials |
| Implement Date | 2015-09-01 |
Price
$ 47
Subtotal
$ 47
Tax
$ 0.00
Order Total (incl. tax)
$ 47