PDF
GB/T 14847-1993
GB/T 14847-1993 Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Replaced |
| Standard Code | GB/T 14847-1993 |
| CCS | \nTest methods for the physical properties of metals |
| ICS | Semiconductor materials |
| Implement Date | 1994-09-01 |
Price
$ 36
Subtotal
$ 36
Tax
$ 0.00
Order Total (incl. tax)
$ 36