GB/T 14847-1993 Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance

GB/T 14847-2010 Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance

GB/T 6379-1986 Precision of test methods Determination of repeatability and reproducibility for a standard test method by interlaboratory tests GB/T 6379.1-2004 Accuracy(trueness and precision)of measurement methods and results—Part 1:General principles and definitions GB/T 6379.2-2004 Accuracy(trueness and precision)of measurement methods and results—Part 2:Basic method for the determination of repeatability and reproducibility of a standard measurement method GB/T 6379.3-2012 Accuracy(trueness and precision)of measurement methods and results—Part 3:Intermediate measures of the precision of a standard measurement method GB/T 6379.4-2006 Accuracy (trueness and precision) of measurement methods and results—Part 4:Basic methods for the determination of the trueness of a standard measurement method GB/T 6379.5-2006 Accuracy (trueness and precision) of measurement methods and results—Part 5:alternative methods for the determination of the precision of a standard measurement method GB/T 6379.6-2009 Accuracy(trueness and precision)of measurement methods and results—Part 6:Use in practice of accuracy values GB/T 6379.4-2025 Accuracy(trueness and precision)of measurement methods and results—Part 4:Basic methods for the determination of the trueness of a standard measurement method

ASTM F95-89