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T/CNS 81-2022 Active
T/CNS 81-2022 Charge-coupled device proton-induced damage effect simulation test method
Abstract
Scope: This document is applicable to the irradiation test of CCD displacement damage effects in aerospace applications; Main technical content: This document describes the general requirements, test methods, and procedures for conducting irradiation tests of displacement damage effects on charge-coupled devices (CCDs) using protons.
General Product Information
| Document Type | Group standards |
|---|---|
| Standard Status | Active |
| Standard Code | T/CNS 81-2022 |
| CCS | Energy, nuclear technology |
| ICS | Nuclear energy complex |
| Implement Date | 2023-04-01 |
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