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GB/T 4937.3-2012 Active
GB/T 4937.3-2012 Semiconductor devices—Mechanical and climatic tests methods—Part 3:External visual examination
Abstract
The purpose of this part of GB/T 4937 is to verify whether the materials, design, structure, marking, and process quality of semiconductor devices comply with the requirements of the applicable procurement documents. External visual inspection is a non-destructive test, suitable for all packaging types. This test is used for appraisal inspection, process monitoring, and batch acceptance.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.3-2012 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2013-02-15 |
Price
$ 42
Subtotal
$ 42
Tax
$ 0.00
Order Total (incl. tax)
$ 42