GB/T 4937.3-2012 Active National standards

GB/T 4937.3-2012 Semiconductor devices—Mechanical and climatic tests methods—Part 3:External visual examination

Publish Date: 2012-11-05 Implement Date: 2013-02-15 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 4937.3-2012

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor discrete devices

ICS Name: Integrated Components of Semiconductor Devices

Publish Date: 2012-11-05

Implement Date: 2013-02-15

Pages: 5 pages

Scope

The purpose of this part of GB/T 4937 is to verify whether the materials, design, structure, marking, and process quality of semiconductor devices comply with the requirements of the applicable procurement documents. External visual inspection is a non-destructive test, suitable for all packaging types. This test is used for appraisal inspection, process monitoring, and batch acceptance.