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GB/T 32188-2015 Active
GB/T 32188-2015 Test method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
Abstract
This standard specifies the method of using a double-crystal X-ray diffractometer to test the half-peak width of the swing curve of GaN single-crystal substrates. This standard is applicable to GaN single-crystal substrates grown by chemical vapor deposition and other methods.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 32188-2015 |
| CCS | \nTest methods for the physical properties of metals |
| ICS | \nMetal material testing |
| Implement Date | 2016-11-01 |
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