GB/T 32188-2015 Active National standards

GB/T 32188-2015 Test method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate

GB/T 32188-2015 Test method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate

Publish Date: 2015-12-10 Implement Date: 2016-11-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 32188-2015
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: \nTest methods for the physical properties of metals
ICS Name: \nMetal material testing
Publish Date: 2015-12-10
Implement Date: 2016-11-01
Pages: 8 pages

Scope

This standard specifies the method of using a double-crystal X-ray diffractometer to test the half-peak width of the swing curve of GaN single-crystal substrates. This standard is applicable to GaN single-crystal substrates grown by chemical vapor deposition and other methods.

Development Information

Word Count: 14 Thousand words Pages: 8 pages

Referenced Standards

Related Standards

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