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GB/T 1555-2009
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
Abstract
This standard specifies the methods for determining the orientation of semiconductor single crystals by X-ray diffraction and optical mapping.
This standard is applicable to determining the surface orientation of semiconductor single crystal materials that are roughly parallel to the low-index atomic planes.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Replaced |
| Standard Code | GB/T 1555-2009 |
| CCS | Semi-metals and semiconductor materials |
| ICS | Semiconductor materials |
| Implement Date | 2010-06-01 |
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