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GB/T 4937.4-2012 Active
GB/T 4937.4-2012 Semiconductor devices—Mechanical and climatic test methods—Part 4:Damp heat,steady state,highly accelerated stress test(HAST)
Abstract
This part of GB/T 4937 specifies the High Accelerated Steady-State Humidity and Thermal Test (HAST) method for evaluating the reliability of non-airtight encapsulated semiconductor devices in humid environments.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.4-2012 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2013-02-15 |
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