GB/T 14264-1993
Replaced
GB/T 4937.4-2012
Active
National standards
GB/T 4937.4-2012 Semiconductor devices—Mechanical and climatic test methods—Part 4:Damp heat,steady state,highly accelerated stress test(HAST)
GB/T 4937.4-2012 Semiconductor devices—Mechanical and climatic test methods—Part 4:Damp heat,steady state,highly accelerated stress test(HAST)
Basic Information
Standard Code:
GB/T 4937.4-2012
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
Integrated Components of Semiconductor Devices
Publish Date:
2012-11-05
Implement Date:
2013-02-15
Pages:
7 pages
Scope
This part of GB/T 4937 specifies the High Accelerated Steady-State Humidity and Thermal Test (HAST) method for evaluating the reliability of non-airtight encapsulated semiconductor devices in humid environments.
Development Information
Same series standard
Adopt standards
IEC 60749-4:2002
Related Standards
GB/T 14844-1993
Replaced
GB/T 14844-1993 Designations of semiconductor materials
GB/T 17573-1998
Active
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General
GB/T 12560-1999
Active
GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices
GB/T 11499-2001
Active
GB/T 11499-2001 Letter symbols for discrete semiconductor devices
GB/T 20521-2006
Active