GB/T 4937.17-2018 Active
GB/T 4937.17-2018 Semiconductor devices—Mechanical and climatic test methods—Part 17:Neutron irradiation
Abstract
This part of GB/T 4937 is designed to determine the sensitivity of semiconductor devices to performance degradation in a neutron environment. This part is applicable to integrated circuits and discrete semiconductor devices. Neutron irradiation is mainly used for military or space-related applications and is a destructive test. The purposes of the test are as follows: a) to detect and measure the relationship between the degradation of key parameters of semiconductor devices and the neutron dose; b) to determine whether the specified parameters of semiconductor devices are within the specified limits after receiving a specified level of neutron dose radiation (see Chapter 4).
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.17-2018 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2019-01-01 |