PDF
YS/T 23-1992
YS/T 23-1992 The method of measuring the thickness of a silicon epitaxial layer using stacking dislocation size
General Product Information
| Document Type | Industry standards-Non-ferrous metals |
|---|---|
| Standard Status | Abolished |
| Standard Code | YS/T 23-1992 |
| Implement Date | 1993-01-01 |
Price
$ 20.00
Subtotal
$ 20.00
Tax
$ 0.00
Order Total (incl. tax)
$ 20.00