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GB/T 30859-2014 Active
GB/T 30859-2014 Test method for warp and waviness of silicon wafers for solar cells
Abstract
This standard specifies the test methods for the warpage and ripple of silicon wafers used in solar cells (hereinafter referred to as silicon wafers).
This standard is applicable to the testing of the warpage and ripple of silicon wafers.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 30859-2014 |
| CCS | \nTest methods for the physical properties of metals |
| ICS | \nMetal material testing |
| Implement Date | 2015-04-01 |
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