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GB/T 43034.3-2023 Active
GB/T 43034.3-2023 Integrated circuits—Measurement of impulse immunity—Part 3:Non-synchronous transient injection method
Abstract
This document specifies the immunity measurement method for integrated circuits (ICs) against standard conducted electrical transient disturbances. Disturbances that are not synchronized with the operation of the device under test (DUT) are applied to the IC pins through a coupling network. Regardless of whether the electrical transient disturbances are within the specified operating voltage range of the IC, this method can obtain the correlation between the conducted electrical transient disturbances and the degradation of IC performance caused by them, and classify them accordingly.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 43034.3-2023 |
| CCS | Semiconductor integrated circuits |
| ICS | Integrated circuits, microelectronics |
| Implement Date | 2024-01-01 |
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