GB/T 4589.1-2006 Active
GB/T 4589.1-2006 Semiconductor devices—Part 10:Generic specification for discrete devices and integrated circuits
Abstract
This specification forms part of the International Electrotechnical Commission's Electronic Component Quality Assessment System (IECQ). This specification is a general standard for semiconductor devices (discrete devices and integrated circuits, including multi-chip integrated circuits, but excluding hybrid circuits). This specification defines the general procedures for quality assessment adopted within the IECQ system and provides general principles for the following aspects: — Electrical characteristics testing methods; — Climate and mechanical testing; — Durability testing. Note: When there are approved sub-specifications, family specifications, and blank detailed specifications applicable to a specific type or types of devices, these specifications must be used to supplement this specification.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4589.1-2006 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2007-02-01 |