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GB/T 6617-1995
GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Replaced |
| Standard Code | GB/T 6617-1995 |
| CCS | \nTest methods for the physical properties of metals |
| ICS | Non-ferrous metals |
| Implement Date | 1995-12-01 |
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