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GB/T 4377-2018 Active
GB/T 4377-2018 Semiconductor integrated circuits—Measuring method of voltage regulators
Abstract
This standard specifies the test methods for the parameters of voltage regulators (hereinafter referred to as devices). This standard is applicable to the testing of voltage regulator parameters in the field of semiconductor integrated circuits.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4377-2018 |
| CCS | Semiconductor integrated circuits |
| ICS | Integrated circuits, microelectronics |
| Implement Date | 2018-08-01 |
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