SJ/T 10322-1992 Ceramic base body for use in metal film fixed resistors

GB/T 2421-1999 Environmental testing for electric and electronic products—Part 1:General and guidance GB/T 2421-2020 Environmental testing—General and guidance GB/T 2421.1-2008 Environmental testing for electric and electronic products—General and guidance GB/T 2421.2-2008 Environmental testing for electric and electronic products—Information for specification writers—Test summaries GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 2828.2-2008 Sampling procedures for inspection by attributes—Part 2:Sampling plans indexed by limiting quality(LQ)for isolated lot inspection GB/T 2828.3-2008 Sampling procedures for inspection by attributes—Part 3:Skip-lot sampling procedures GB/T 2828.4-2008 Sampling procedures for inspection by attributes—Part 4:Procedures for assessment of declared quality levels GB/T 2828.5-2011 Sampling procedures for inspection by attributes—Part 5:System of sequential sampling plans indexed by acceptance quality limit(AQL)for lot-by-lot inspection GB/T 2828.10-2010 Sampling procedures for inspection by attributes—Part 10:Introduction to the GB/T 2828 series of standards for sampling for inspection by attributes GB/T 2828.11-2008 Sampling procedures for inspection by attributes—Part 11:Procedures for assessment of declared quality levels for small population GB/T 5593-1996 Structure ceramic materials used in electronic components GB/T 5593-2015 Structure ceramic materials used in electronic component and device GB/T 5594.1-1985 Test methods for properties of structure ceramic used in electronic components—Test method for gas-tightness GB/T 5594.2-1985 Test methods for properties of structure ceramic used in electronic components—Test method for Youngs elastic modulus and Poisson ratio GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion GB/T 5594.3-2015 Test methods for properties of structure ceramicused in electronic components and device—Part 3:Test method for mean coefficient of linear expansion GB/T 5594.4-1985 Test methods for properties of structure ceramic used in electronic components—Test method for dielectric loss angle tangent value GB/T 5594.4-2015 Test methods for properties of structure ceramic used in electronic component and device—Part 4:Test method for permittivity and dielectric loss angle tangent value GB/T 5594.5-1985 Test methods for properties of structure ceramic used in electronic components—Test method for volume resistivity GB/T 5594.6-1985 Test methods for properties of structure ceramic used in electronic components—Test method for chemical durability GB/T 5594.6-2015 Test methods for properties of structure ceramics used in electronic component and device—Part 6:Test method for chemical durability GB/T 5594.7-1985 Test methods for properties of structure ceramic used in electronic components—Test method for liquid permeability GB/T 5594.7-2015 Test methods for properties of structure ceramicused in electronic components and device—Part 7:Test method for liquid permeability GB/T 5594.8-1985 Test methods for properties of structure ceramic used in electronic components—Determination of microstructure GB/T 5594.8-2015 Test methods for properties of structure ceramic used in electronic components and device—Part 8:Test method for microstructure