GB/T 14264-1993
Replaced
GB/T 4937.35-2024
Active
National standards
GB/T 4937.35-2024 Semiconductor devices—Mechanical and climatic test methods—Part 35:Acoustic microscopy for plastic encapsulated electronic components
GB/T 4937.35-2024 Semiconductor devices—Mechanical and climatic test methods—Part 35:Acoustic microscopy for plastic encapsulated electronic components
Price:
$ 75
Basic Information
Standard Code:
GB/T 4937.35-2024
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
Integrated Components of Semiconductor Devices
Publish Date:
2024-03-15
Implement Date:
2024-07-01
Pages:
24 pages
Scope
This document specifies the procedure for acoustic microscopy inspection of plastic-encapsulated electronic components. This document provides a method for using acoustic microscopy to inspect plastic packages for defects (delamination, cracks, molding voids, etc.), which is a reproducible, non-destructive testing method.
Development Information
Same series standard
Adopt standards
IEC 60749-35:2006
Related Standards
GB/T 14844-1993
Replaced
GB/T 14844-1993 Designations of semiconductor materials
GB/T 17573-1998
Active
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General
GB/T 12560-1999
Active
GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices
GB/T 11499-2001
Active
GB/T 11499-2001 Letter symbols for discrete semiconductor devices
GB/T 20521-2006
Active