GB/T 40069-2021 Nanotechnologies—Measurement of the number of layers of graphene-related two-dimensional (2D) materials—Raman spectroscopy method
GB/T 40069-2021 Nanotechnologies—Measurement of the number of layers of graphene-related two-dimensional (2D) materials—Raman spectroscopy method
Basic Information
Scope
This document specifies the method of using Raman spectroscopy to measure the number of layers of graphene-related two-dimensional materials.
This document is applicable to the measurement of the number of layers of graphene flakes prepared by mechanical exfoliation with a lateral size of not less than 2 μm. Graphene flakes prepared by chemical vapor deposition (CVD) with AB stacking or ABC stacking can refer to this method for implementation.
Note 1: When measuring the number of layers of graphene flakes, several methods can be used individually or in combination to measure and verify each other.
Note 2: Chapter 5 presents the linear method (Method A) based on the 2D model. Chapter 6 presents the Raman spectroscopy method for measuring the number of layers of graphene flakes based on the peak height of the silicon Raman model on the SiO2/Si substrate (Method B). Appendix A presents a summary list of various methods for measuring the number of layers of graphene flakes by Raman spectroscopy. Appendix B presents the Raman spectroscopy method for measuring the number of layers of graphene flakes based on the peak height of the G model of graphene flakes (Method C).