GB/T 36357-2018 Technical specification for middle power light-emitting diode chips

GB/T 2423.4-2008 Environmental testing for electric and electronic products—Part 2:Test method—Test Db:Damp heat,cyclic(12 h+12 h cycle) GB/T 2423.15-2008 Environmental testing for electric and electronic products—Part 2:Tests methods—Test Ga and guidance: Acceleration,steady GB/T 2423.22-2012 Environmental testing—Part 2:Test methods—Test N:Change of temperature GB/T 4589.1-2006 Semiconductor devices—Part 10:Generic specification for discrete devices and integrated circuits GB/T 4937.1-2006 Semiconductor devices—Mechanical and climatic test methods—Part 1:General SJ/T 11394-2009 IEC 60749(所有部分) IEC 60749-19:2010 IEC 60749-22:2002 SJ/T 11399-2009 SJ/T 11399-2009 Semiconductor Light Emitting Diode Chip Test Method