GB/T 6570-1986
Abolished
GB/T 4937.1-2006
Active
National standards
GB/T 4937.1-2006 Semiconductor devices—Mechanical and climatic test methods—Part 1:General
GB/T 4937.1-2006 Semiconductor devices—Mechanical and climatic test methods—Part 1:General
Basic Information
Standard Code:
GB/T 4937.1-2006
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
Diode
Publish Date:
2006-08-23
Implement Date:
2007-02-01
Pages:
6 pages
Scope
This part is applicable to semiconductor devices (discrete devices and integrated circuits) and establishes general guidelines for other parts of the GB/T 4937 series. When there are contradictions between this part and the corresponding detailed specifications, the detailed specifications shall prevail.
Development Information
Same series standard
Replace the following standards
Referenced Standards
IEC 60050(所有部分)
IEC 60747(所有部分)
IEC 60748(所有部分)
Adopt standards
IEC 60749-1:2002
Related Standards
GB/T 12562-1990
Abolished
GB/T 12562-1990 Blank detail specification for PIN diodes
GB/T 13063-1991
Abolished
GB/T 13063-1991 Blank detail specification for current-regulator and current-reference diodes
GB/T 15137-1994
Abolished
GB/T 15137-1994 Blank detail specification for gunn diodes
GB/T 15177-1994
Abolished
GB/T 15177-1994 Blank detail specification for microwave detectors and mixer diodes
GB/T 15178-1994
Abolished