GB/T 15245-2002 Abolished National standards

GB/T 15245-2002 Quantitative analysis of rare earth element(REE)oxides by electron probe microanalysis(EPMA)

Publish Date: 2002-11-11 Implement Date: 2003-06-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 15245-2002

Standard Type: National standards

Standard Status: Abolished

is_force_gb: no

CCS Name: Electronic optics and other physical optical instruments

ICS Name: Optical measurement instruments

Publish Date: 2002-11-11

Implement Date: 2003-06-01

Pages: 9 pages

Development Information

Word Count: 15 Thousand words Pages: 9 pages

Replace the following standards

GB 15245-1994

Referenced Standards

GB/T 4930-1993 General specification of electron probe microanalysis standard specimen GB/T 4930-2008 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs) GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs) GB/T 15074-1994 General guide for EPMA quantitative analysis GB/T 15074-2008 General guide of quantitative analysis by EPMA GB/T 15074-2025 General specification for EPMA quantitative analysis

Related Standards

GB/T 3158-1982 abolished_transferred

GB/T 3158-1982 Radii of spherical surfaces of optical elements series of numerical values

Publish Date: 1982-08-10

GB/T 6321-1986 Replaced

GB/T 6321-1986 Spring-optical measuring heads,opticators

Publish Date: 1986-04-24

GB/T 6322-1986 Replaced

GB/T 6322-1986 Types and dimensions of plain limit gauges

Publish Date: 1986-04-24

GB/T 7895-1987 Replaced

GB/T 7895-1987 Optical grade synthetic quartz crystal

Publish Date: 1987-06-05

GB/T 7896-1987 Replaced

GB/T 7896-1987 Test method for optical grade synthetic quartz crystal

Publish Date: 1987-06-05

GB 12526-1990 Active

GB 12526-1990 Specifications for long range electro-optical distance measurement

Publish Date: 1990-12-06