GB/T 15074-2008 Active National standards

GB/T 15074-2008 General guide of quantitative analysis by EPMA

Publish Date: 2008-06-16 Implement Date: 2009-03-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 15074-2008

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Electrochemical, thermochemical, and optical analytical instruments

ICS Name: Other standards related to analytical chemistry

Publish Date: 2008-06-16

Implement Date: 2009-03-01

Pages: 11 pages

Scope

This standard specifies the requirements for the installation of instruments, working conditions, selection of reference samples, basic operating procedures, various correction methods, and the content of result reports during the quantitative analysis of samples using electron probes. This standard is applicable to electron probe analyzers equipped with spectrometers for the quantitative analysis and measurement of the elemental composition of samples, as well as data processing.

Development Information

Word Count: 18 Thousand words Pages: 11 pages

Replace the following standards

GB/T 15074-1994 General guide for EPMA quantitative analysis

Superseded by the following standards

GB/T 15074-2025 General specification for EPMA quantitative analysis

Referenced Standards

ISO 22309:2006 ISO 23833:2006 ISO/IEC 17025:2005 GB/T 4930-1993 General specification of electron probe microanalysis standard specimen GB/T 4930-2008 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs) GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials(CRMs) GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry GB/T 20725-2025 Microbeam analysis—Electron probe microanalysis—Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

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