MT/T 707-1997
Active
GB/T 20724-2021
Active
National standards
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
Basic Information
Standard Code:
GB/T 20724-2021
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electrochemical, thermochemical, and optical analytical instruments
ICS Name:
Other standards related to analytical chemistry
Publish Date:
2021-12-31
Implement Date:
2022-07-01
Publisher:
国家市场监督管理总局、国家标准化管理委员会
Technical Committee:
全国微束分析标准化技术委员会(SAC/TC 38)
Pages:
20 pages
Scope
本文件描述了用透射电子显微镜/扫描透射电子显微镜测定薄晶体试样厚度的会聚束电子衍射方法。本文件适用于测定线度为几十纳米至几百微米、厚度在几十纳米至几百纳米范围内的薄晶体试样厚度。注： 由于透射电子显微镜薄试样的厚度往往不均匀，用会聚束衍射方法测定的是试样被电子束照明区的局域厚度。
Development Information
Drafting Units:
北京科技大学、中国航发北京航空材料研究院
Drafting Persons:
柳得橹、娄艳芝
Replace the following standards
Referenced Standards
Related Standards
GB/T 20724-2006
Replaced
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 20725-2006
Active
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 20726-2006
Replaced
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
LY/T 1082-2008
Replaced
LY/T 1082-2008 Test method for analysis of vegetable tannin extracts
LY/T 1083-2008
Replaced