MT/T 707-1997
Replaced
GB/T 20724-2021
Active
National standards
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
Price:
$ 75
Basic Information
Standard Code:
GB/T 20724-2021
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electrochemical, thermochemical, and optical analytical instruments
ICS Name:
Other standards related to analytical chemistry
Publish Date:
2021-12-31
Implement Date:
2022-07-01
Pages:
20 pages
Scope
This document describes the convergent beam electron diffraction method for measuring the thickness of thin crystal samples using transmission electron microscopes/scanning transmission electron microscopes. This document is suitable for measuring the thickness of thin crystal samples with dimensions ranging from tens of nanometers to hundreds of micrometers, and thicknesses ranging from tens of nanometers to hundreds of nanometers. Note: Since the thickness of thin samples in transmission electron microscopes is often uneven, the localized thickness of the sample illuminated by the electron beam is measured using the convergent beam diffraction method.
Development Information
Replace the following standards
Referenced Standards
Related Standards
GB/T 20724-2006
Replaced
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 20725-2006
Active
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 20726-2006
Replaced
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
LY/T 1082-2008
Replaced
LY/T 1082-2008 Test method for analysis of vegetable tannin extracts
LY/T 1083-2008
Replaced