SJ/T 11767-2020 Active Industry standards-Electronics

SJ/T 11767-2020 SJ/T 11767-2020 Diode Low Frequency Noise Parameter Test Method

Publish Date: 2020-12-09 Implement Date: 2021-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: SJ/T 11767-2020

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor diode

ICS Name: Integrated Components of Semiconductor Devices

Publish Date: 2020-12-09

Implement Date: 2021-04-01

Scope

It is suitable for testing the noise parameters of diodes within a frequency range of 1 Hz to 300 kHz.

Development Information

Related Standards

GB/T 14264-1993 Replaced

GB/T 14264-1993 Semiconductor materials—Terms and definitions

Publish Date: 1993-03-12

GB/T 14844-1993 Replaced

GB/T 14844-1993 Designations of semiconductor materials

Publish Date: 1993-12-24

GB/T 17573-1998 Active

GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General

Publish Date: 1998-11-17

GB/T 12560-1999 Active

GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices

Publish Date: 1999-08-02

GB/T 11499-2001 Active

GB/T 11499-2001 Letter symbols for discrete semiconductor devices

Publish Date: 2001-11-05

GB/T 20521-2006 Active

GB/T 20521-2006 Semiconductor devices—Part 14-1:Semiconductor sensors—General and classification

Publish Date: 2006-08-23