GB/T 4855-1984
Abolished
GB/T 33929-2017
Active
National standards
GB/T 33929-2017 Test methods of the performance for MEMS high g accelerometer
GB/T 33929-2017 Test methods of the performance for MEMS high g accelerometer
Basic Information
Standard Code:
GB/T 33929-2017
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Microcircuit
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2017-07-12
Implement Date:
2018-02-01
Pages:
14 pages
Scope
This standard specifies the electrical performance and basic performance terms and definitions, test conditions, general provisions for testing, and test items and methods for MEMS high-g value acceleration sensors. This standard is applicable to the performance testing of MEMS high-g value acceleration sensors (hereinafter referred to as acceleration sensors) with a measurement range of 1×104g to 2×105g.
Development Information
Referenced Standards
GB/T 2421.1-2008 Environmental testing for electric and electronic products—General and guidance
GB/T 7665-2005 General terminology for transducers
GB/T 26111-2010 Micro-electromechanical system technology—Terms
GB/T 26111-2023 Micro-electromechanical system technology—Terms
JJF 1156-2006 Terminology and Definitions for Measurement of Vibration,Shock and Rotating Velocity
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished