GB/T 4855-1984
Abolished
GB/T 42709.5-2023
Active
National standards
GB/T 42709.5-2023 Semiconductor devices—Micro-electromechanical devices—Part 5:RF MEMS switches
GB/T 42709.5-2023 Semiconductor devices—Micro-electromechanical devices—Part 5:RF MEMS switches
Basic Information
Standard Code:
GB/T 42709.5-2023
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2023-05-23
Implement Date:
2023-09-01
Pages:
32 pages
Scope
This document defines the terms, definitions, and symbols used to evaluate and determine the basic ratings and characteristics of radio frequency MEMS switches, and describes the parameter testing methods. This document is applicable to various types of radio frequency MEMS switches. A general description of radio frequency MEMS switches is provided in Appendix A. Classified by contact method, they include DC contact type switches and capacitive contact type switches; classified by structure, they include series switches and parallel switches, and a description of the geometric structure of radio frequency MEMS switches is provided in Appendix B; classified by switching network, they include single-pole single-throw switches, single-pole double-throw switches, and double-pole double-throw switches; classified by drive method, they include electrostatic drive switches, thermoelectric drive switches, electromagnetic drive switches, and piezoelectric drive switches. Radio frequency MEMS switches are widely used in multi-band or multi-mode mobile phones, intelligent radar systems, reconfigurable radio frequency devices and systems, SDR (Software Defined Radio) phones, testing equipment, tunable devices and systems, and satellites. An application description of radio frequency MEMS switches is provided in Appendix E.
Development Information
Same series standard
Referenced Standards
GB/T 4937.12-2018 Semiconductor devices—Mechanical and climatic test methods—Part 12:Vibration,variable frequency
GB/T 4937.27-2023 Semiconductor devices—Mechanical and climatic test methods—Part 27:Electrostatic discharge (ESD) sensitivity testing—Machine model (MM)
IEC 60747-1:2006
IEC 60747-16-1
IEC 60747-16-4:2004
IEC 60749-5:2017
IEC 60749-10:2022
Adopt standards
IEC 62047-5:2011
Related Standards
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