JJF 2060-2023 Production of Sub-micron and Nanometer Particle Size Reference Materials

ISO 15900 JJF 1001-1998 General Terms in Metrology and Their Definitions JJF 1001-2011 General Terms in Metrology and Their Definitions JJF 1005-2016 General Terms and Definitions Used in Connection with Reference Materials JJF 1059.1-2012 Evaluation and Expression of Uncertainty in Measurement JJF 1186-2007 The Rules for Drafting of Contents for Certificates and Labels of Certified Reference Materials JJF 1186-2018 Requirements of Reference Materials Certificates and Labels JJF 1218-2009 The Rule for Drafting in Report of Reference Materials JJF 1342-2012 General Requirements for Reference Material Producers JJF 1342-2022 General Requirements for the Competence of Reference Material Producers JJF 1343-2012 General and Statistical Principles for Characterization of Reference Materials JJF 1343-2022 Characterization,Homogeneity and Stability Assessment of Reference Materials GB/T 16418-1996 Particle system—Vocabulary GB/T 16418-2008 Particle system—Vocabulary GB/T 21649.1-2008 Particle size analysis—Image analysis methods—Part 1:Static image analysis method GB/T 21649.1-2024 Particle size analysis—Image analysis methods—Part 1:Static image analysis methods GB/T 29022-2012 Particle size analysis—Dynamic light scattering (DLS) GB/T 29022-2021 Particle size analysis—Dynamic light scattering (DLS) GB/T 32269-2015 Nanotechnologies—Terminology and definitions for nano-objects—Nanoparticle, nanofibre and nanoplate GB/T 33714-2017 Nanotechnology—Test method for size of nanoparticles—Atomic force microscopy JJF 1218-2025 Requirements for Drafting of Reference Material Research and Development Reports