YS/T 1755-2025 Active Industry standards-Non-ferrous metals

YS/T 1755-2025 Determination of Total Metal Impurity Content in Granular Silicon by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)

YS/T 1755-2025 Determination of Total Metal Impurity Content in Granular Silicon by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)

Publish Date: 2025-04-10 Implement Date: 2025-11-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: YS/T 1755-2025
Standard Type: Industry standards
Standard Status: Active
is_force_gb: no
CCS Name: Analysis methods for semi-metallic and semiconductor materials
ICS Name: \nMetal material testing
Publish Date: 2025-04-10
Implement Date: 2025-11-01

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