T/CSTM 00003-2019 Active Group standards

T/CSTM 00003-2019 Two-dimensional Material Thickness Measurement by Atomic Force Microscopy Method

T/CSTM 00003-2019 Two-dimensional material thickness measurement using atomic force microscopy

Publish Date: 2019-01-03 Implement Date: 2019-02-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: T/CSTM 00003-2019
Standard Type: Group standards
Standard Status: Active
is_force_gb: no
CCS Name: Testing machines and non-destructive testing instruments
ICS Name: Physics, Chemistry
Publish Date: 2019-01-03
Implement Date: 2019-02-01

Scope

Main technical content: This standard specifies the principles, instrumentation, sample pretreatment, testing methods, thickness calculation methods, uncertainty evaluation of measurement results, and test reports for atomic force microscopy in measuring the thickness of two-dimensional materials. This standard is applicable to the measurement of the thickness of two-dimensional materials that can form steps with the substrate.

Development Information

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