GB/T 1423-1996
Active
GB/T 31353-2014
Active
National standards
GB/T 31353-2014 Test methods for bow of sapphire substrates
GB/T 31353-2014 Test methods for bow of sapphire substrates
Basic Information
Standard Code:
GB/T 31353-2014
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
\nTest methods for the physical properties of metals
ICS Name:
Other testing methods for metal materials
Publish Date:
2014-12-31
Implement Date:
2015-09-01
Pages:
7 pages
Scope
This standard specifies the test method for the bending degree of sapphire cutting discs, grinding discs, and polishing discs (hereinafter referred to as sapphire substrate discs).
This standard is applicable to the bending degree test of sapphire substrate discs with a diameter of 50.8 mm to 304.8 mm and a thickness of not less than 200 μm.
Development Information
Referenced Standards
GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 6619-1995 Test methods for bow of silicon slices
GB/T 6619-2009 Test methods for bow of silicon wafers
GB/T 14264-1993 Semiconductor materials—Terms and definitions
GB/T 14264-2009 Semiconductor materials—Terms and definitions
GB/T 14264-2024 Terminology of semiconductor materials
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GB/T 17433-1998 Foundation terms for chemical analysis of metallurgical products
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GB/T 4334.2-2000
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