GB/T 4855-1984
Abolished
T/CIE 133-2022
Active
Group standards
T/CIE 133-2022 Test method for data retention time of magnetic random access memory device
T/CIE 133-2022 Test method for data retention time of magnetic random access memory device
Price:
$ 22.00
Basic Information
Standard Code:
T/CIE 133-2022
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2022-08-10
Implement Date:
2022-08-10
Pages:
16 pages
Scope
This document specifies the test principles, test environment, test equipment, and test procedures for the data retention time test of magnetic random access memory devices. This document is applicable to the data retention time test of magnetic random access memory devices and the verification of the data retention time of magnetic random access memory devices.
Development Information
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished