GB/T 14264-1993
Replaced
T/CASAS 030-2023
Active
Group standards
T/CASAS 030-2023 Test Method for GaN Millimeter-Wave Front-End Chips
T/CASAS 030-2023
Price:
$ 20.00
Basic Information
Standard Code:
T/CASAS 030-2023
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
-
ICS Name:
Integrated Components of Semiconductor Devices
Publish Date:
2023-06-30
Implement Date:
2023-07-01
Pages:
12 pages
Scope
Main technical content: T/CASAS 030—2023, "Test Methods for GaN Millimeter-Wave Front-End Chips", describes the terminology, definitions, test conditions, test requirements, and test methods of GaN millimeter-wave front-end chips. It combines the experience summarized by researchers in the field of millimeter-wave GaN front-end chips in recent years in terms of R&D, test evaluation, and application, and provides detailed regulations for the test methods of the performance indicators of millimeter-wave GaN front-end chips, including but not limited to test purposes, test environments, test methods and steps, test tools and instruments, etc.
Development Information
Related Standards
GB/T 14844-1993
Replaced
GB/T 14844-1993 Designations of semiconductor materials
GB/T 17573-1998
Active
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General
GB/T 12560-1999
Active
GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices
GB/T 11499-2001
Active
GB/T 11499-2001 Letter symbols for discrete semiconductor devices
GB/T 20521-2006
Active